Paper
Quiteron
S.M. Faris, S.I. Raider, et al.
IEEE Transactions on Magnetics
The time-averaged current induced by incident radiation across electronic tunneling junctions is shown experimentally and theoretically to have a highly nonlinear dependence on the field intensity for a range of tunneling barrier thickness.
S.M. Faris, S.I. Raider, et al.
IEEE Transactions on Magnetics
S.M. Faris
IEEE Circuits and Systems Magazine
S. Washburn, R.A. Webb, et al.
Physical Review Letters
S.M. Faris, N.F. Pedersen
Physica B+C