Conference paper
Characterization of a next generation step-and-scan system
Timothy J. Wiltshire, Joseph P. Kirk, et al.
SPIE Advanced Lithography 1998
In this paper, two families of reduced-complexity algorithms for decoding low-density parity-check (LDPC) codes based on incorporating either a normalization or a correction term in the check-node update are presented. A simplified symbol-node update can also be used. Using simulations, it is shown that these simplified belief propagation (BP) approaches provide near optimum performance with different classes of LDPC codes.
Timothy J. Wiltshire, Joseph P. Kirk, et al.
SPIE Advanced Lithography 1998
Matthew A Grayson
Journal of Complexity
Moutaz Fakhry, Yuri Granik, et al.
SPIE Photomask Technology + EUV Lithography 2011
R.A. Brualdi, A.J. Hoffman
Linear Algebra and Its Applications