Sang-Min Park, Mark P. Stoykovich, et al.
Advanced Materials
A practical multiport measurement method is presented for the precise characterization of an N-port device using a two-port vector network analyzer. Because the N - 2 unused ports need not be terminated with matched loads, a test fixture can be simplified. Any influence of the reflections from the unterminated ports can be deembedded by port renormalization. The proposed method was verified with a coupled microstrip line structure. © 2007 IEEE.
Sang-Min Park, Mark P. Stoykovich, et al.
Advanced Materials
J.V. Harzer, B. Hillebrands, et al.
Journal of Magnetism and Magnetic Materials
J.H. Stathis, R. Bolam, et al.
INFOS 2005
Eloisa Bentivegna
Big Data 2022