Andreas C. Cangellaris, Karen M. Coperich, et al.
EMC 2001
A practical multiport measurement method is presented for the precise characterization of an N-port device using a two-port vector network analyzer. Because the N - 2 unused ports need not be terminated with matched loads, a test fixture can be simplified. Any influence of the reflections from the unterminated ports can be deembedded by port renormalization. The proposed method was verified with a coupled microstrip line structure. © 2007 IEEE.
Andreas C. Cangellaris, Karen M. Coperich, et al.
EMC 2001
Xikun Hu, Wenlin Liu, et al.
IEEE J-STARS
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
K.N. Tu
Materials Science and Engineering: A