Min Yang, Jeremy Schaub, et al.
Technical Digest-International Electron Devices Meeting
A low-energy electron-diffraction intensity analysis of data from a clean Ag{001} surface finds no multilayer relaxation, i.e., with dik being the change in spacing between layer i and layer k, d12=0±0.03 and d23=0±0.03. These results are compared with the results of first-principles total-energy calculations and with other recent relaxation determinations on fcc {001} surfaces. © 1991 The American Physical Society.
Min Yang, Jeremy Schaub, et al.
Technical Digest-International Electron Devices Meeting
A. Nagarajan, S. Mukherjee, et al.
Journal of Applied Mechanics, Transactions ASME
J. Paraszczak, J.M. Shaw, et al.
Micro and Nano Engineering
Corneliu Constantinescu
SPIE Optical Engineering + Applications 2009