Conference paper
Convergence properties of multi-dimensional stack filters
Peter Wendt
Electronic Imaging: Advanced Devices and Systems 1990
Peter Wendt
Electronic Imaging: Advanced Devices and Systems 1990
Fausto Bernardini, Holly Rushmeier
Proceedings of SPIE - The International Society for Optical Engineering
Jaione Tirapu Azpiroz, Alan E. Rosenbluth, et al.
SPIE Photomask Technology + EUV Lithography 2009
Mario Blaum, John L. Fan, et al.
IEEE International Symposium on Information Theory - Proceedings