On the dynamic resistance and reliability of phase change memory
B. Rajendran, M.H. Lee, et al.
VLSI Technology 2008
In this paper we describe the fabrication of oxide based devices similar in architecture to a conventional FRT with source, drain, and gate electrodes and a channel. This distinctive characteristic of our device is the use of a channel material capable of undergoing a field-induced Molt insulator-metal transition at room temperature. Lithographic techniques developed for oxide materials have been combined with pulsed laser deposition of perovskite materials onto single-crystal strontium titanate (STO) substrates to fabricate these devices. Materials chosen for j the Mott transition channel include La2CuO4 (LCO) and YBCO, p-type; and Nd.i, n-type. © 1999 Materials Research Society.
B. Rajendran, M.H. Lee, et al.
VLSI Technology 2008
Zelek S. Herman, Robert F. Kirchner, et al.
Inorganic Chemistry
Andreas C. Cangellaris, Karen M. Coperich, et al.
EMC 2001
Mitsuru Ueda, Hideharu Mori, et al.
Journal of Polymer Science Part A: Polymer Chemistry