Daniel J. Coady, Amanda C. Engler, et al.
ACS Macro Letters
A field effect transistor device (FET), consisting of a nonlinear Mott Insulator channel material, and a high dielectric-constant gate oxide, is explored as a nanoscale device. Experimental functionality of a large scale prototype (5 μm channel length) has been demonstrated. The underlying physics of the device is analyzed and modeled using a time-dependent Hartree approach. Timing estimates suggest a relatively short switching time.
Daniel J. Coady, Amanda C. Engler, et al.
ACS Macro Letters
John G. Long, Peter C. Searson, et al.
JES
D.D. Awschalom, J.-M. Halbout
Journal of Magnetism and Magnetic Materials
P.C. Pattnaik, D.M. Newns
Physical Review B