Min Yang, Jeremy Schaub, et al.
Technical Digest-International Electron Devices Meeting
This paper describes a number of significant modeling considerations for SiGe heterojunction bipolar transistor power amplifiers operating at millimeter-wave frequencies. Small-and large-signal model-to-hardware correlation is presented for single transistor amplifiers, as well as for a combined dual-stage amplifier up to 65 GHz. The relevant parasitic effects are described along with the proposed modeling approach for each of them. The limits of the standard Vertical Bipolar Inter-Company device model at high-injection and their effect on the prediction of the achievable large-signal compression and power-added efficiency are also discussed. © 2006 IEEE.
Min Yang, Jeremy Schaub, et al.
Technical Digest-International Electron Devices Meeting
J. Tersoff
Applied Surface Science
Elizabeth A. Sholler, Frederick M. Meyer, et al.
SPIE AeroSense 1997
J.A. Barker, D. Henderson, et al.
Molecular Physics