PaperSpecial Correspondence Effect of Randomness in the Distribution of Impurity Ions on FET Thresholds in Integrated ElectronicsRobert W. KeyesIEEE JSSC
PaperThe Role of Low Temperatures in the Operation of Logic CircuitryRobert W. Keyes, Erik P. Harris, et al.Proceedings of the IEEE
ReviewLimitations of silicon devices for quantum computingRobert W. KeyesJournal of Physics Condensed Matter
