Paper

01 Jan 1977

Microstructure fabrication

View publication

Abstract

No abstract available.

Related

Paper

Scaling, Small Numbers and Randomness in Semiconductors

Robert W. Keyes

IEEE Circuits and Devices Magazine

Paper

Explaining strain

Robert W. Keyes

IEEE Circuits and Devices Magazine

Paper

Fundamental limits of silicon

Robert W. Keyes

Proceedings of the IEEE

Paper

Power dissipation in information processing

Robert W. Keyes

Science

View all publications