PaperSpecial Correspondence Effect of Randomness in the Distribution of Impurity Ions on FET Thresholds in Integrated ElectronicsRobert W. KeyesIEEE JSSC
PaperInformation, computing technology, and quantum computingRobert W. KeyesJournal of Physics Condensed Matter
PaperComponent variability as a limit in digital electronicsRobert W. KeyesJournal of Computational Electronics
