PaperSome properties of crystallized tantalum pentoxide thin films on siliconG.S. Oehrlein, F.M. D'Heurle, et al.Journal of Applied Physics
PaperStability of C49 and C54 phases of TiSi2 under ion bombardmentS. Motakef, J.M.E. Harper, et al.Journal of Applied Physics
PaperCorrelation between chemistry and the amount of mixing in bilayers submitted to ion bombardmentF.M. D'Heurle, J.E.E. Baglin, et al.Journal of Applied Physics
