Measuring Jitter and Phase Error in Microprocessor Phase-Locked Loops

Keith A. Jenkins; James P. Eckhardt

doi:10.1109/54.844337

IEEE Design and Test of Computers

Paper

01 Apr 2000

Measuring Jitter and Phase Error in Microprocessor Phase-Locked Loops

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Abstract

Excessive "jitter," caused primarily by power supply noise, can detract from the advantages of phase-locked loops. Moreover, in a multichip system, the accumulated phase error must be measured - not just the jitter.

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Measurement of the switching speed of single FET's

Keith A. Jenkins, Joachim N. Burghartz

IEEE Transactions on Electron Devices

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High-Performance Emitter-Up/Down SiGe HBT's

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IEEE Electron Device Letters

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Electron mobility in thin In_0.53Ga_0.47As channel

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ESSDERC 2017

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Abstract

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