Conal E. Murray, I.C. Noyan
Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties
The emission of alpha particles from materials used to manufacture semiconductors can contribute substantially to the single-event upset rate. The alpha particles originate from contamination in the materials, or from radioactive isotopes, themselves. In this review paper, we discuss the sources of the radioactivity and the measurement methods to detect the emitted particles.
Conal E. Murray, I.C. Noyan
Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties
Judson R. Holt, Anita Madan, et al.
Journal of Applied Physics
Oliver C. Wells, Michael S. Gordon, et al.
ScMi 2012
I.C. Noyan, Conal E. Murray, et al.
Applied Physics Letters