M.E. López-Morales, R.J. Savoy, et al.
Journal of Materials Research
An infrared temperature measurement system was used to measure hot spots in a magnetic head rigid disk interface. The system employed the spectral distribution as well as intensity of sampled radiation to determine both the temperature and effective area of microscopic sources at elevated temperature. Flash temperatures between particulate and thin-film rigid disks and a simulated transparent sapphire slider at various operating conditions were measured. © 1991 by ASME.
M.E. López-Morales, R.J. Savoy, et al.
Journal of Materials Research
S. Cohen, T.O. Sedgwick, et al.
MRS Proceedings 1983
C.-K. Hu, K.Y. Lee, et al.
Thin Solid Films
D. Edelstein
MRS Spring 1998