Sang-Min Park, Mark P. Stoykovich, et al.
Advanced Materials
An infrared temperature measurement system was used to measure hot spots in a magnetic head rigid disk interface. The system employed the spectral distribution as well as intensity of sampled radiation to determine both the temperature and effective area of microscopic sources at elevated temperature. Flash temperatures between particulate and thin-film rigid disks and a simulated transparent sapphire slider at various operating conditions were measured. © 1991 by ASME.
Sang-Min Park, Mark P. Stoykovich, et al.
Advanced Materials
D.E. Fowler, D.C. Miller
Surface Science Spectra
E.A. Giess, B.A. Scott, et al.
Materials Research Bulletin
Francois Pagette, Paul M. Solomon, et al.
MRS Proceedings 2008