Joy Y. Cheng, Daniel P. Sanders, et al.
SPIE Advanced Lithography 2008
The penetration depth of a magnetic field into a superconducting YBa2Cu3O7-x film was measured by polarized neutron reflection. The sample comprised an epitaxial film with the c-axis of its orthorhombic structure perpendicular to the film's surface. Measurements at 14 K showed that a magnetic field (parallel to the surface) penetrates into the surface over a depth of 1400 Å. © 1989.
Joy Y. Cheng, Daniel P. Sanders, et al.
SPIE Advanced Lithography 2008
Sharee J. McNab, Richard J. Blaikie
Materials Research Society Symposium - Proceedings
D.D. Awschalom, J.-M. Halbout
Journal of Magnetism and Magnetic Materials
Julian J. Hsieh
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films