J. Paraszczak, J.M. Shaw, et al.
Micro and Nano Engineering
The magnetic field dependence of the critical current of single YiBa2Cu307-8 grain boundary junctions has been measured as a function of temperature and orientation. A significant residual critical current is observed which increases with decreasing angle of misorientation at a given field and temperature. The data are in qualitative accord with a model in which the grain boundary comprises of a large number of micro-bridges in parallel. © 1993 IEEE
J. Paraszczak, J.M. Shaw, et al.
Micro and Nano Engineering
O.F. Schirmer, K.W. Blazey, et al.
Physical Review B
K.A. Chao
Physical Review B
A. Ney, R. Rajaram, et al.
Journal of Magnetism and Magnetic Materials