Investigations of silicon nano-crystal floating gate memories
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
Measurements of the normal muonium depolarization rate in high purity silicon and germanium have been performed between 1.5 and 4.2 K. Two different Si samples and one Ge sample were investigated in a transverse field of 5 G, and in all cases, a temperature-independent depolarization rate was observed. The silicon results disagree with earlier work which showed a depolarization rate which decreased with increasing temperature in this temperature range. These results are compared with measurements of the direct muonium hyperfine transition. © 1984 J.C. Baltzer AG, Scientific Publishing Company, and Yamada Science Foundation.
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
O.F. Schirmer, K.W. Blazey, et al.
Physical Review B
J. Paraszczak, J.M. Shaw, et al.
Micro and Nano Engineering
A. Gangulee, F.M. D'Heurle
Thin Solid Films