O.F. Schirmer, K.W. Blazey, et al.
Physical Review B
A force microscope has been used to deposit and image localized charge on insulating surfaces. The charge is deposited either by applying a voltage pulse to the microscope tip or by contact charging the insulator surface with the tip. An improved mode of charge imaging is presented, which distinguishes between charge and topography and allows the sign of the charge to be determined in a single scan. © 1990, American Vacuum Society. All rights reserved.
O.F. Schirmer, K.W. Blazey, et al.
Physical Review B
Mark W. Dowley
Solid State Communications
Oliver Schilter, Alain Vaucher, et al.
Digital Discovery
Frank Stem
C R C Critical Reviews in Solid State Sciences