Conference paper
Resilient low voltage accelerators for high energy efficiency
Nandhini Chandramoorthy, Karthik Swaminathan, et al.
HPCA 2019
Paper
Lifetime reliability: Toward an architectural solution
Abstract
As scaling threatens to erode reliability standards, lifetime reliability must become a first-class design constraint. Microarchitectural intervention offers a novel way to manage lifetime reliability without significantly sacrificing cost and performance. © 2005 IEEE.
Related
Conference paper
Power management of multi-core chips: Challenges and pitfalls
Pradip Bose, Alper Buyuktosunoglu, et al.
DATE 2012
Conference paper
Dynamic power gating with quality guarantees
Anita Lungu, Pradip Bose, et al.
ISLPED 2009
David M. Brooks, Pradip Bose, et al.
IEEE Micro