Conference paper
Performance measurement and data base design
Alfonso P. Cardenas, Larry F. Bowman, et al.
ACM Annual Conference 1975
Alfonso P. Cardenas, Larry F. Bowman, et al.
ACM Annual Conference 1975
Liat Ein-Dor, Y. Goldschmidt, et al.
IBM J. Res. Dev
Michael C. McCord, Violetta Cavalli-Sforza
ACL 2007
Donald Samuels, Ian Stobert
SPIE Photomask Technology + EUV Lithography 2007