Conference paper
Characterization of a next generation step-and-scan system
Timothy J. Wiltshire, Joseph P. Kirk, et al.
SPIE Advanced Lithography 1998
The ability to accurately detect those areas in plain text documents that consist of contiguous text is an important pre-process to many applications. This paper introduces a novel method that uses both spatial and linguistic knowledge in an accurate manner to provide an initial analysis of the document. This initial analysis may then be extended to provide a complete analysis of the text areas in the document.
Timothy J. Wiltshire, Joseph P. Kirk, et al.
SPIE Advanced Lithography 1998
R.B. Morris, Y. Tsuji, et al.
International Journal for Numerical Methods in Engineering
Alfred K. Wong, Antoinette F. Molless, et al.
SPIE Advanced Lithography 2000
Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering