Marc A. Taubenblatt
SUM 2012
A technique is described for measurement of lateral forces on a scanning tunneling microscopy (STM) tip simultaneously with surface topography, using optical sensing of the STM tip vibration. The STM tip is caused to vibrate near a resonant mode in the lateral direction, using the capacitive forces between the tip and the surface under study. Topography is monitored using the z-displacement feedback voltage, in a low-frequency loop, while optical sensing of the high-frequency tip vibration amplitude monitors lateral forces acting on the tip.
Marc A. Taubenblatt
SUM 2012
R. Strassle, S. Gerke, et al.
CHASE 2017
Marc A. Taubenblatt
Applied Physics Letters
Philip C. D. Hobbs, Marc A. Taubenblatt
Photonics East 1996