Arnon Amir, Michael Lindenbaum
IEEE Transactions on Pattern Analysis and Machine Intelligence
No abstract available.
Arnon Amir, Michael Lindenbaum
IEEE Transactions on Pattern Analysis and Machine Intelligence
D.S. Turaga, K. Ratakonda, et al.
SCC 2006
David L. Shealy, John A. Hoffnagle
SPIE Optical Engineering + Applications 2007
A. Skumanich
SPIE OE/LASE 1992