PaperLarge UV-induced negative index changes in germanium-free nitrogen-doped planar SiO2 waveguidesD. Wiesmann, J. Hübner, et al.Electronics Letters
PaperField stitching in thermal probe lithography by means of surface roughness correlationPh. Paul, A.W. Knoll, et al.Nanotechnology
PaperFundamental scaling properties of electro-mechanical switchesA.W. Knoll, D. Grogg, et al.New Journal of Physics
Conference paperFeedback enhanced thermo-electric topography sensingA. Sebastian, D. Wiesmann, et al.TRANSDUCERS 2009