PaperAn evaluation of an ultralow background alpha-particle detectorMichael S. Gordon, David F. Heidel, et al.IEEE TNS
Conference paperA circuit-sensitive methodology for evaluating substrate noiseJohn Liobe, Keith A. JenkinsRFIC 2005
PaperFlip-flop upsets from single-event-transients in 65 nm clock circuitsLarry Wissel, David F. Heidel, et al.IEEE TNS