Thomas H. Baum, Carl E. Larson, et al.
Journal of Organometallic Chemistry
We report on the interfacial intermixing of ultrathin Co films on a Cu(001) single crystal, two materials that are immiscible in the bulk. With increasing deposition rate we find a crossover from layer-by-layer to bilayer growth due to a hindered diffusion from the first layer to the substrate. Above two monolayers, growth proceeds in a layer-by-layer fashion. These effects are explained in terms of surface free energies. © 1997 Elsevier Science B.V.
Thomas H. Baum, Carl E. Larson, et al.
Journal of Organometallic Chemistry
William Hinsberg, Joy Cheng, et al.
SPIE Advanced Lithography 2010
S.F. Fan, W.B. Yun, et al.
Proceedings of SPIE 1989
Lawrence Suchow, Norman R. Stemple
JES