M.A. Lutz, R.M. Feenstra, et al.
Surface Science
NiMnSb thin films have been etched in plasma chemistries ICl and IBr, under inductively coupled plasma conditions. These interhalogens produce practical etch rates (500-1500 Å/min-1) provided the incident ion energy is above threshold values (∼120 eV for ICl, ∼230eV for IBr) and there is a balance of etch product formation and desorption through control of the ion and reactive neutral fluxes. Both chemistries appear promising for pattern transfer in NiMnSb-based spin polarized magnetic devices. © 1999 The Electrochemical Society. All rights reserved.
M.A. Lutz, R.M. Feenstra, et al.
Surface Science
Lawrence Suchow, Norman R. Stemple
JES
A.B. McLean, R.H. Williams
Journal of Physics C: Solid State Physics
K.N. Tu
Materials Science and Engineering: A