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Micro and Nano Engineering
Interdiffusion in PbIn thin film couples has been examined by an X-ray diffraction technique. Initial results indicate that the interdiffusion in such couples is significantly faster than that expected from reported bulk data. © 1975.
J. Paraszczak, J.M. Shaw, et al.
Micro and Nano Engineering
Dipanjan Gope, Albert E. Ruehli, et al.
IEEE T-MTT
M.A. Lutz, R.M. Feenstra, et al.
Surface Science
P. Martensson, R.M. Feenstra
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films