PaperEnhanced "tail" diffusion of phosphorus and boron in silicon: Self-interstitial phenomenaF.F. Morehead, R.F. LeverApplied Physics Letters
PaperInjection mechanism and recombination kinetics in electroluminescent cdte diodesF.F. MoreheadJournal of Applied Physics
PaperExact description and data fitting of ion-implanted dopant profile evolution during annealingR. Ghez, G.S. Oehrlein, et al.Applied Physics Letters
PaperLight Sensitive, Efficient Electroluminescent ZnTe Switching DiodesB.L. Crowder, F.F. MoreheadIEEE T-ED
