Infrared chemiluminescence from XeF2-silicon-surface reactions

Abstract

Infrared luminescence has been observed and the emission spectra in the 2.5-8.0-m region determined for a silicon crystal exposed to XeF2 gas. In contrast to the broad and structureless emission in the uv and visible regions previously reported for some gassolid systems, the ir spectrum exhibits characteristic fine structure. Furthermore, the emitted radiation shows strong polarization and angular dependence indicating that the emitting species are on the crystal surface. © 1979 The American Physical Society.