Conference paper
Compression for data archiving and backup revisited
Corneliu Constantinescu
SPIE Optical Engineering + Applications 2009
The resistivity of ultrathin metallic films on semiconductor surfaces can be obtained from inelastic electron scattering measurements. Illustrative applications to Au and Pd films on Si(111) and to Ag films on GaAs(111) are presented. A general discussion about the nature of the quasi-elastic peak in EELS from various surfaces is also presented. © 1986.
Corneliu Constantinescu
SPIE Optical Engineering + Applications 2009
I. Morgenstern, K.A. Müller, et al.
Physica B: Physics of Condensed Matter
A.B. McLean, R.H. Williams
Journal of Physics C: Solid State Physics
J.C. Marinace
JES