Dipanjan Gope, Albert E. Ruehli, et al.
IEEE T-MTT
This paper presents a methodology based on a semi-analytical scattering model to pre-design the characteristic impedance of multi-layered through hole vias by choosing appropriate via geometrical parameters, dielectric property, and the placement of ground vias. A linear model as a function of design parameters above is further applied to analyze the statistical variation of impedance for different tolerance specification. © 2008 IEEE.
Dipanjan Gope, Albert E. Ruehli, et al.
IEEE T-MTT
Arun Reddy Chada, Young H. Kwark, et al.
EPEPS 2009
Albert E. Ruehli
IEICE Transactions on Communications
Ki Jin Han, Mark B. Ritter, et al.
EPEPS 2010