IBM experiments in soft fails in computer electronics (1978-1994)

J.F. Ziegler; H.W. Curtis; H.P. Muhlfeld; C. Montrose; B. Chin; M. Nicewicz; C.A. Russell; W.Y. Wang; L.B. Freeman; P. Hosier; L.E. LaFave; J.L. Walsh; J.M. Orro; G.J. Unger; J.M. Ross; T.J. O&#039;Gorman; B. Messina; T.D. Sullivan; A.J. Sykes; H. Yourke; T.A. Enger; V. Tolat; T.S. Scott; A.H. Taber; R.J. Sussman; W.A. Klein; C.W. Wahaus

doi:10.1147/rd.401.0003

IBM J. Res. Dev

Paper

01 Jan 1996

IBM experiments in soft fails in computer electronics (1978-1994)

View publication

Abstract

This historical review covers IBM experiments in evaluating radiation-induced soft fails in LSI electronics over a fifteen-year period, concentrating on major scientific and technical advances which have not been previously published.

Conference paper

Modeling polarization for Hyper-NA lithography tools and masks

Kafai Lai, Alan E. Rosenbluth, et al.

SPIE Advanced Lithography 2007

Conference paper

Automatic taxonomy generation: Issues and possibilities

Raghu Krishnapuram, Krishna Kummamuru

IFSA 2003

Paper

A hierarchical screening algorithm for reactive power optimization in distribution networks

Xinyi Su, Guangyu He, et al.

Dianli Xitong Zidonghua/Automation of Electric Power Systems

Paper

Tight bounds for delay-sensitive aggregation

Yvonne Anne Pignolet, Stefan Schmid, et al.

Discrete Mathematics and Theoretical Computer Science

View all publications

Abstract

Related

Modeling polarization for Hyper-NA lithography tools and masks

Automatic taxonomy generation: Issues and possibilities

A hierarchical screening algorithm for reactive power optimization in distribution networks

Tight bounds for delay-sensitive aggregation