E. Gusev, D.A. Buchanan, et al.
Technical Digest - International Electron Devices Meeting
We have developed an electron lithography method, hot electron emission lithography, which is capable of printing integrated circuits with an exposure time of only a few seconds. The basic design and fabrication of the patterned electron emitting mask made by standard metal-oxide-semiconductor technology will be discussed, and its applicability in a simple 1 e-beam stepper will be demonstrated. Patterns with a minimum feature size of 160 nm have been printed successfully. Further improvements in resolution to 50 nm appear to be possible. © 1998 American Institute of Physics.
E. Gusev, D.A. Buchanan, et al.
Technical Digest - International Electron Devices Meeting
F.M. Ross, P.A. Bennett, et al.
Micron
Y.-H. Kim, C. Cabral Jr., et al.
IEDM 2005
R.M. Tromp
Journal of Physics Condensed Matter