Frank Stem
C R C Critical Reviews in Solid State Sciences
A simple u.v. curing process is described that renders micron sized images in AZ resists resistant to flow when heated to temperatures as high as 210° C. The u.v. treatment prevents the image flow problems usually encountered in reactive ion etching processes. © 1981, The Electrochemical Society, Inc. All rights reserved.
Frank Stem
C R C Critical Reviews in Solid State Sciences
John G. Long, Peter C. Searson, et al.
JES
J. Paraszczak, J.M. Shaw, et al.
Micro and Nano Engineering
A. Krol, C.J. Sher, et al.
Surface Science