Full vectorial imaging of electromagnetic light at subwavelength scale

Abstract

We propose a near-field imaging concept for obtaining a complete experimental description of the structure of light in three dimensions around nanodevices. Our approach is based on a near-field microscope able to simultaneously and independently map the phase and amplitude distributions of two orthogonal electric-field components at the sample surface. From a single 2D acquisition of these two components, the complementary electric and magnetic field lines and Poynting vector distributions are reconstructed in a volume above the sample using rigorous numerical methods. This experimental analysis of localized electric and magnetic optical effects as well as energy flows at the subwavelength scale enables the development of a complete electromagnetic diagnostic of nano-optical devices and metamaterials © 2010 Optical Society of America.