Conference paperComputational and Monte-Carlo aspects of systems for monitoring reliability dataEmmanuel YashchinCOMPSTAT 2010
PaperApplication of three-parameter lognormal distribution in EM data analysisBaozhen Li, Emmanuel Yashchin, et al.Microelectronics Reliability
PaperParametric estimation for window censored recurrence dataYada Zhu, Emmanuel Yashchin, et al.Technometrics