PaperScaling, Small Numbers and Randomness in SemiconductorsRobert W. KeyesIEEE Circuits and Devices Magazine
PaperSpecial Correspondence Effect of Randomness in the Distribution of Impurity Ions on FET Thresholds in Integrated ElectronicsRobert W. KeyesIEEE JSSC
PaperPropagation of microwave phonons in germaniumM. Pomerantz, Robert W. Keyes, et al.Physical Review Letters