B. Özyilmaz, A.D. Kent, et al.
Physical Review Letters
We present room-temperature ferromagnetic resonance (FMR) studies of polycrystalline ∥Pt10 nm Cut Co10 nm CuPt∥ films as a function of Co layer thickness (1≤t≤10 nm) grown by evaporation and magnetron sputtering. FMR was studied with a high-frequency broadband coplanar waveguide (up to 25 GHz) using a flip-chip method. The resonance field and the linewidth were measured as functions of the ferromagnetic layer thickness. The evaporated films exhibit a lower magnetization density (Ms =1131 emu cm3) compared to the sputtered films (Ms =1333 emu cm3), with practically equal perpendicular surface anisotropy (Ks ≃-0.5 erg cm2). For both series of films, a strong increase of the linewidth was observed for Co layer thickness below 3 nm. For films with a ferromagnetic layer thinner than 4 nm, the damping of the sputtered films is larger than that of the evaporated films. The dependence of the linewidth can be understood in terms of the spin-pumping effect, from which the interface spin-mixing conductance is deduced. © 2006 American Institute of Physics.
B. Özyilmaz, A.D. Kent, et al.
Physical Review Letters
W. Chen, G. De Loubens, et al.
Applied Physics Letters
J. Yu, U. Rüdiger, et al.
Physical Review B - CMMP
W. Chen, M.J. Rooks, et al.
Physical Review B - CMMP