PaperModeling of a Bubble-Memory Organization with Self-Checking Translators to Achieve High ReliabilityWillard G. Bouricius, William C. Carter, et al.IEEE TC
Conference paperSymbolic simulation for correct machine designWilliam C. Carter, William H. Joyner, et al.DAC 1979
PaperImplementation of an Experimental Fault-Tolerant Memory SystemWilliam C. Carter, Charles E. McCarthyIEEE TC