H.K. Olsson, R.H. Koch, et al.
Physical Review Letters
Novel ac biasing and detection techniques have been developed to allow a scanning tunneling microscope (STM) to measure spatial variations in electric potential on metallic surfaces with sub-μV sensitivity. When implemented with a room-temperature STM operating with minimal electrical shielding and no vibration isolation, the voltage sensitivity was limited by the thermal (Johnson) noise of the tunneling resistance.
H.K. Olsson, R.H. Koch, et al.
Physical Review Letters
C. Dekker, P.J.M. Wöltgens, et al.
Physical Review Letters
R.H. Koch, W. Reim, et al.
Journal of Applied Physics
A. Hartstein, R.H. Koch
ICNN 1987