Publication
Review of Scientific Instruments
Paper

Extremely low-noise potentiometry with a scanning tunneling microscope

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Abstract

Novel ac biasing and detection techniques have been developed to allow a scanning tunneling microscope (STM) to measure spatial variations in electric potential on metallic surfaces with sub-μV sensitivity. When implemented with a room-temperature STM operating with minimal electrical shielding and no vibration isolation, the voltage sensitivity was limited by the thermal (Johnson) noise of the tunneling resistance.

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Publication

Review of Scientific Instruments

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