Satoshi Oida, James B. Hannon, et al.
Applied Physics Letters
The LEEM-IV spectra of few-layer graphene show characteristic minima at specific energies, which depend on the number of graphene layers. For the same samples, low-energy TEM (eV-TEM) spectra exhibit transmission maxima at energies corresponding to those of the reflection minima in LEEM. Both features can be understood from interferences of the electron wave function in a purely elastic model. Inelastic scattering processes in turn lead to a finite, energy-dependent inelastic Mean Free Path (MFP) and a lower finesse of the interference features. Here we develop a model that introduces both an elastic and inelastic scattering parameter on the wave-function level, thus reconciling the models considered previously. Fitting to published data, we extract the elastic and inelastic MFP self-consistently and compare these to recent reports.
Satoshi Oida, James B. Hannon, et al.
Applied Physics Letters
J. Jobst, A. J.H. van der Torren, et al.
Nature Communications
Rudolf M. Tromp
Ultramicroscopy
Jaap Kautz, V.A.E.C. Janssen, et al.
Surface Science