Skip to main content
Research
  • Blog
  • Publications
  • Careers
  • Focus areas
  • Semiconductors
  • Artificial Intelligence
  • Quantum Computing
  • Hybrid Cloud
  • About
  • Overview
  • Labs
  • People
  • Semiconductors
  • Artificial Intelligence
  • Quantum Computing
  • Hybrid Cloud
  • Overview
  • Labs
  • People
IBM logo
Research
  • Focus areas
    • Semiconductors
    • Artificial Intelligence
    • Quantum Computing
    • Hybrid Cloud
  • Blog
  • Publications
  • Careers
  • About
    • Overview
    • Labs
    • People
IEEE Circuits and Devices Magazine
Paper
01 Sep 2002

Explaining strain

View publication

Abstract

No abstract available.

Related

Paper

Fundamental Limits in Digital Information Processing

Robert W. Keyes

Proceedings of the IEEE

Paper

Physical limits of silicon transistors and circuits

Robert W. Keyes

Reports on Progress in Physics

Paper

Physical problems and limits in computer logic

Robert W. Keyes

IEEE Spectrum

Paper

Special Correspondence Effect of Randomness in the Distribution of Impurity Ions on FET Thresholds in Integrated Electronics

Robert W. Keyes

IEEE JSSC

View all publications
  1. Home
  2. ↳ Publications

Date

01 Sep 2002

Publication

IEEE Circuits and Devices Magazine

Authors

  • Robert W. Keyes
IBM-affiliated at time of publication

Resources

  • Publication

Share

IBM Logo
  • Focus areas

    • Semiconductors
    • Artificial Intelligence
    • Quantum Computing
    • Hybrid Cloud
  • Quick links

    • About
    • Publications
    • Blog
    • Events
  • Work with us

    • Careers
    • Contact Research
  • Directories

    • Topics
    • People
    • Projects
  • Follow us

    • Newsletter
    • X
    • LinkedIn
    • YouTube
    • RSS
  • Contact IBM
  • Privacy
  • Terms of use
  • Accessibility