Conference paper
Studies of EELS L2,3 absorption fine structure in thin silicon
P.E. Batson
Microscopy of Semiconducting Materials 1991
P.E. Batson
Microscopy of Semiconducting Materials 1991
P.E. Batson
Review of Scientific Instruments
P.E. Batson
Ultramicroscopy
T.S. Kuan, P.E. Batson, et al.
Journal of Applied Physics