T. Hashizume, R.J. Hamers, et al.
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
New low-energy electron-diffraction intensity measurements and dynamical calculations indicate that oxygen in a c(2×2) overlayer resides 0.800.025 above the top layer of Ni atoms and is displaced 0.300.1 from the fourfold hollow position along a 110 direction. This produces a structure having C2V symmetry with two inequivalent nearest-neighbor Ni-O bond distances of 1.750.05 and 2.140.08. © 1983 The American Physical Society.
T. Hashizume, R.J. Hamers, et al.
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
J.E. Demuth, Ph. Avouris, et al.
Journal of Electron Spectroscopy and Related Phenomena
J.E. Demuth, K. Christmann, et al.
Chemical Physics Letters
J.W.M. Frenken, R.J. Hamers, et al.
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films