Sang-Min Park, Mark P. Stoykovich, et al.
Advanced Materials
Results are presented detailing the crystallographic quality of a number of metal films deposited by epitaxial sputter deposition. Such films have single-orientation f.c.c., h.c.p., b.c.c. and hybrid crystal structures, and include the elements Ag, Au, Co, Cr, Cu, Fe, Rh, Ru, Pd and V. The crystal structure was characterized using X-ray diffraction analysis.
Sang-Min Park, Mark P. Stoykovich, et al.
Advanced Materials
Ronald Troutman
Synthetic Metals
Surendra B. Anantharaman, Joachim Kohlbrecher, et al.
MRS Fall Meeting 2020
J. Paraszczak, J.M. Shaw, et al.
Micro and Nano Engineering