Sung Ho Kim, Oun-Ho Park, et al.
Small
A large enhancement of the parametrically generated backward-propagating elastic wave in Si: In is reported. The enhancement is observed when the nonlinear interaction between microwave electric and elastic fields occurs at the interface between the Si sample and the sputtered thin-film ZnO ultrasonic transducer. Phase and spectral information is presented. No satisfactory mechanism for the enhancement is known. © 1982 The American Physical Society.
Sung Ho Kim, Oun-Ho Park, et al.
Small
J.H. Kaufman, Owen R. Melroy, et al.
Synthetic Metals
S.F. Fan, W.B. Yun, et al.
Proceedings of SPIE 1989
J.H. Stathis, R. Bolam, et al.
INFOS 2005