Conference paper
True 3-D displays for avionics and mission crewstations
Elizabeth A. Sholler, Frederick M. Meyer, et al.
SPIE AeroSense 1997
This paper presents a review of electron‐sensitive resists evaluated for electron beam exposure. This includes positive as well as negative resists and their relative merits and drawbacks. The paper also presents general guidelines that can be used in evaluating any electron resist system for performance and usefulness in electron beam microfabrication. Copyright © 1974 Society of Plastics Engineers, Inc.
Elizabeth A. Sholler, Frederick M. Meyer, et al.
SPIE AeroSense 1997
Heinz Schmid, Hans Biebuyck, et al.
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
R. Ghez, J.S. Lew
Journal of Crystal Growth
Min Yang, Jeremy Schaub, et al.
Technical Digest-International Electron Devices Meeting