Conference paper
C4NP technology: Present and future
Eric Perfecto, Da-Yuan Shih, et al.
GBC 2008
It is well known that electromigration (EM) time-to-failure for ac is several orders of magnitude larger than for dc. We propose a novel technique that reverses current direction in the power delivery system of a microprocessor every time it is rebooted. This improves EM time-to-failure of solder bumps and on-chip global interconnects and vias in the power delivery system. © 2007 IEEE.
Eric Perfecto, Da-Yuan Shih, et al.
GBC 2008
John U. Knickerbocker, Paul S. Andry, et al.
IBM J. Res. Dev
Bing Dang, Steven L. Wright, et al.
IBM J. Res. Dev
Timothy O. Dickson, Yong Liu, et al.
IEEE Journal of Solid-State Circuits