A. Gangulee, F.M. D'Heurle
Thin Solid Films
An analysis of mass transport during electromigration in Al+Ni thin-film conductors indicates an anomalously large grain-boundary diffusivity of Ni in Al+Ni. This large value may be explained if the grain-boundary adsorption coefficient for solute atoms is assumed to be inversely proportional to the solubility limit.
A. Gangulee, F.M. D'Heurle
Thin Solid Films
R.L. Anderson, J.E.E. Baglin, et al.
Applied Physics Letters
A. Bourret, F.M. D'Heurle, et al.
Journal of Applied Physics
R.C. Taylor, A. Gangulee
Journal of Applied Physics