S. Zirinsky, W.N. Hammer, et al.
Applied Physics Letters
An analysis of mass transport during electromigration in Al+Ni thin-film conductors indicates an anomalously large grain-boundary diffusivity of Ni in Al+Ni. This large value may be explained if the grain-boundary adsorption coefficient for solute atoms is assumed to be inversely proportional to the solubility limit.
S. Zirinsky, W.N. Hammer, et al.
Applied Physics Letters
A. Gangulee, F.M. d'Heurle
Thin Solid Films
R. Mann, G.L. Miles, et al.
Applied Physics Letters
A. Gangulee, F.M. D'Heurle
Applied Physics Letters