R.H. Koch, A. Hartstein
Physical Review Letters
A model is constructed where a nonequilibrium vacancy concentration resulting from electromigration-induced mass flux divergences is responsible for damage in the form of wedge-like and/or crack-like voids as well as thinning of extended areas. The damage morphology is primarily a function of temperature.
R.H. Koch, A. Hartstein
Physical Review Letters
S.I. Woods, Nesco M. Lettsome, et al.
ISTFA 2003
H.K. Olsson, R.H. Koch, et al.
Journal of Applied Physics
R.B. Laibowitz, R.H. Koch, et al.
Physical Review B