R.H. Koch, C.P. Umbach, et al.
Physica C: Superconductivity and its Applications
Paper
Electromigration-induced vacancy behavior in unpassivated thin films
Abstract
A model is constructed where a nonequilibrium vacancy concentration resulting from electromigration-induced mass flux divergences is responsible for damage in the form of wedge-like and/or crack-like voids as well as thinning of extended areas. The damage morphology is primarily a function of temperature.
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